Testing Advanced Analysis and Imaging

 

There is the capability of obtaining images of the microstructure using optical and scanning electron microscopes (SEMs). This utilises small samples that can be chemically or thermally etched to reveal the microstructure. On the other hand, EBSD methods can be used to characterise the grain structure depending on the orientation of the planes within the grains structure. This advanced method can be used as a backup method to understand the morphology of materials under certain conditions. The chemical analysis is very important and this can be carried out using the EDS techniques that are incorporated within the SEM. This method can provide accurate quantifications of the elemental compositions of any material under investigation. Other techniques are available such as X-ray imaging which provides a mean to investigate the internal structure of materials without causing any damage to components and hence termed as a ‘non-destructive’ technique. To study the dislocations generated within the material, the TEM can be utilised and this requires very thin foils, typically about 100 microns. The existence of dislocations depend on the imposed stress and temperature levels and can significantly affect the mechanical behaviour of materials.